Effect of the n+sinker in self-triggering bipolar ESD protection structures

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2002-January, Issue , 2002, Pages 277-283

  De Heyn, Vincent ^a   Iyer, Natarajan M ^a   Groeseneken, Guido ^a,c   Reynders, Koen ^b   Moens, Peter ^c  

^a IMEC   (Belgium)

^b LUCENT TECHNOLOGIES   (United States)

^c UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Batteries; Charge pumps; CMOS technology; Current measurement; Electrostatic discharge; Leakage current; Microelectronics; Protection; Pulse measurements; Voltage

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTROSTATIC DISCHARGE; LEAKAGE CURRENTS; MICROELECTRONICS; SOLAR CELLS;

CHARGE PUMP; CMOS TECHNOLOGY; ELECTRIC FIELD DISTRIBUTIONS; ESD PROTECTION; PROTECTION; PULSE MEASUREMENTS; SELF-TRIGGERING; THERMOELECTRICAL SIMULATIONS;

ELECTROSTATIC DEVICES;

EID: 84948769499     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. P. Moens et al., "I3T80 : A 0.35 μm Based System-on-Chip Technology for 42C Battery Automotive Applications", ISPSD2002, June3-7, 2002, Santa Fe, USA. Accepted as oral presentation.
2. V. De Heyn et al, "Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage" in International Reliability Physics Symposium. IEEE, 2001. pp. 253-258.
3. B. Keppens et al, "Contributions to standardization of transmission line pulse testing methodology.", in Proceedings EOS/ESD Symp, 2001, pp. 461-467
4. G. Notermans, "On the Use of N-Well Resistors for uniform triggering of ESD protection elements" in Proceedings EOS/ESD Symp, 1997, pp.221-229