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Volumn , Issue , 1994, Pages 273-278
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Capacitive coupling effects in spark-gap devices
a
a
IBM
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CAPACITANCE MEASUREMENT;
ELECTRIC DISCHARGES;
ELECTRIC EQUIPMENT PROTECTION;
ELECTROSTATICS;
THIN FILM DEVICES;
TIME MEASUREMENT;
TRANSIENTS;
VOLTAGE MEASUREMENT;
BREAKDOWN VOLTAGE;
CAPACITIVE COUPLING EFFECTS;
GAP SPACING;
PROBE TIP SPARK GAP;
SPARK GAP DEVICES;
ELECTRIC SPARK GAPS;
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EID: 0028756161
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (21)
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References (9)
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