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Volumn 2002-January, Issue , 2002, Pages 1-6

SEE in-flight data for two static 32KB memories on high earth orbit

Author keywords

Artificial neural networks; Belts; Circuit testing; Cyclic redundancy check; Earth; Extraterrestrial measurements; Protons; Satellites; Telemetry; Uncertainty

Indexed keywords

BELTS; EARTH (PLANET); NEURAL NETWORKS; ORBITS; PROTONS; RADIATION BELTS; SATELLITES; STATIC RANDOM ACCESS STORAGE; TELEMETERING; UNCERTAINTY ANALYSIS;

EID: 84948747746     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2002.1045524     Document Type: Conference Paper
Times cited : (7)

References (11)
  • 2
    • 0028693954 scopus 로고
    • SEE In-Flight Measurement on the MIR Orbital Station
    • p.
    • D. Falguère, S. Duzellier, R. Ecoffet, "SEE In-Flight Measurement on the MIR Orbital Station", IEEE Trans. Nucl. Sci., NS-41, no6, p., 1994.
    • (1994) IEEE Trans. Nucl. Sci. , vol.NS-41 , Issue.6
    • Falguère, D.1    Duzellier, S.2    Ecoffet, R.3
  • 4
    • 84939707512 scopus 로고
    • Observations of Single-Event Upset and Multiple-Bit Upset in Non-Hardened High-Density SRAMs in the TOPEX/Poseidon orbit
    • C.I. Underwood, R. Ecoffet, S. Duzellier, D. Falguère, "Observations of Single-Event Upset and Multiple-Bit Upset in Non-Hardened High-Density SRAMs in the TOPEX/Poseidon orbit", IEEE Radiation Effects Data Workshop Record, p.85, 1993.
    • (1993) IEEE Radiation Effects Data Workshop Record , pp. 85
    • Underwood, C.I.1    Ecoffet, R.2    Duzellier, S.3    Falguère, D.4
  • 9
    • 0034205709 scopus 로고    scopus 로고
    • Radiation Environment of the Microelectronics and Photonics Test Bed as Measured by CREDO-3
    • June
    • C.S. Dyer, C. Sanderson, R. Mugford, C. Watson, C. Peerless, "Radiation Environment of the Microelectronics and Photonics Test Bed as Measured by CREDO-3", IEEE Trans. Nucl. Sci., NS-47, p. 481, June 2000.
    • (2000) IEEE Trans. Nucl. Sci. , vol.NS-47 , pp. 481
    • Dyer, C.S.1    Sanderson, C.2    Mugford, R.3    Watson, C.4    Peerless, C.5
  • 10
    • 0035722230 scopus 로고    scopus 로고
    • Simulation of Heavy-Ion-Induced Failure Mode in n-MOS Cells of ICs
    • December
    • J.G. Loquet, J.P. David, R. Briand, P. Fouillat, "Simulation of Heavy-Ion-Induced Failure Mode in n-MOS Cells of ICs", IEEE Trans. Nucl. Sci., NS-48, p. 2278, December 2001.
    • (2001) IEEE Trans. Nucl. Sci. , vol.NS-48 , pp. 2278
    • Loquet, J.G.1    David, J.P.2    Briand, R.3    Fouillat, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.