Electrostatic discharge (ESD) and failure analysis: Models, methodologies and mechanisms

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn 2002-January, Issue , 2002, Pages 57-63

  Voldman, S H ^a  

^a IBM   (United States)

Author keywords

Analytical models; Circuit simulation; Design methodology; Electrostatic discharge; Failure analysis; Predictive models; Probability distribution; Protection; Robustness; Space vector pulse width modulation

Indexed keywords

ANALYTICAL MODELS; CIRCUIT SIMULATION; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; ELECTROSTATICS; FAILURE (MECHANICAL); INTEGRATED CIRCUITS; MAGNETIC HEADS; PROBABILITY DISTRIBUTIONS; PULSE WIDTH MODULATION; ROBUSTNESS (CONTROL SYSTEMS); VECTOR SPACES; VOLTAGE CONTROL;

DESIGN AND DEVELOPMENT; DESIGN METHODOLOGY; MAGNETIC RECORDING HEADS; PREDICTIVE MODELS; PROTECTION; ROBUST CIRCUITS; SEMICONDUCTOR PRODUCTS; SPACE VECTOR PULSE WIDTH MODULATION;

FAILURE ANALYSIS;

EID: 84948746212     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2002.1025612     Document Type: Conference Paper

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