Mechanisms of Electron-Beam-Induced Damage in Perovskite Thin Films Revealed by Cathodoluminescence Spectroscopy

Journal of Physical Chemistry C

Volumn 119, Issue 48, 2015, Pages 26904-26911

  Xiao, Chuanxiao ^a,b   Li, Zhen ^a   Guthrey, Harvey ^a   Moseley, John ^a,b   Yang, Ye ^a   Wozny, Sarah ^c   Moutinho, Helio ^a   To, Bobby ^a   Berry, Joseph J ^a   Gorman, Brian ^b   Yan, Yanfa ^d   Zhu, Kai ^a   Al Jassim, Mowafak ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Department of Metallurgical and Materials Engineering   (United States)

^c UNIVERSITY OF NEW ORLEANS   (United States)

^d UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; CHARACTERIZATION; DEFECTS; ELECTRON BEAMS; ELECTRONIC PROPERTIES; ELECTRONS; FILMS; GRAIN BOUNDARIES; IRRADIATION; PEROVSKITE; PHASE TRANSITIONS; TEMPERATURE;

CATHODOLUMINESCENCE SPECTROSCOPY; ELECTRON BEAM IRRADIATION; HIGH ENERGY ELECTRON BEAMS; IRRADIATION CONDITIONS; ORGANIC-INORGANIC HYBRID; PEROVSKITE THIN FILMS; SCANNING ELECTRON BEAM; TRANSFORMATION-INDUCED;

THIN FILMS;

EID: 84948656145     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/acs.jpcc.5b09698     Document Type: Article

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