Dynamic supply current testing of analog circuits using wavelet transform

Proceedings of the IEEE VLSI Test Symposium

Volumn 2002-January, Issue , 2002, Pages 302-307

  Bhunia, S ^a   Roy, K ^a  

^a Purdue University   (United States)

Author keywords

Analog circuits; Circuit faults; Circuit testing; Current supplies; Discrete Fourier transforms; Electrical fault detection; Frequency domain analysis; Time domain analysis; Wavelet domain; Wavelet transforms

Indexed keywords

ANALOG CIRCUITS; DESIGN FOR TESTABILITY; DISCRETE FOURIER TRANSFORMS; DISCRETE WAVELET TRANSFORMS; ELECTRIC FAULT LOCATION; ELECTRIC NETWORK ANALYSIS; FAULT DETECTION; FREQUENCY DOMAIN ANALYSIS; VLSI CIRCUITS; WAVELET ANALYSIS; WAVELET DECOMPOSITION; WAVELET TRANSFORMS;

CIRCUIT FAULTS; CIRCUIT TESTING; CURRENT SUPPLIES; ELECTRICAL FAULT DETECTIONS; WAVELET DOMAIN;

TIME DOMAIN ANALYSIS;

EID: 84948406950     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2002.1011158     Document Type: Conference Paper

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