Degradation of Si high-speed photodiodes by irradiation induced defects and restoration at low temperature

Proceedings of the IEEE/LEOS 3rd International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices, NUSOD 2003

Volumn 2003-October, Issue , 2003, Pages

  Laird, Jamie S ^a   Hirao, Toshio ^a   Onoda, Shinobu ^a   Kamiya, Tomihiro ^a  

^a NONE

Author keywords

Bandwidth; Capacitance; Dark current; Degradation; Electrons; Photoconductivity; Photodiodes; Signal restoration; Signal to noise ratio; Temperature

Indexed keywords

BANDWIDTH; CAPACITANCE; DARK CURRENTS; DEGRADATION; ELECTRONS; FREQUENCY RESPONSE; NUMERICAL MODELS; OPTOELECTRONIC DEVICES; PHOTOCONDUCTIVITY; PHOTODIODES; RESTORATION; SEMICONDUCTOR DEVICES; TEMPERATURE;

GENERATION RECOMBINATION; HIGH-ENERGY PARTICLES; IRRADIATION-INDUCED DEFECTS; LOW TEMPERATURES; LOWER TEMPERATURES; RADIATION FIELD; SIGNAL RESTORATION; SIGNAL STRENGTHS;

SIGNAL TO NOISE RATIO;

EID: 84946118169     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NUSOD.2003.1263225     Document Type: Conference Paper

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