High abstraction level permutational ESD concept analysis

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2003-January, Issue , 2003, Pages

  Streibl, M ^a   Zangl, F ^a   Esmark, K ^a   Schwencker, R ^a   Stadler, W ^a   Gossner, H ^a   Druen, S ^b   Schmitt Landsiedel, D ^b  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC DISCHARGE; MIXED SIGNAL INTEGRATED CIRCUITS; MONTE CARLO METHODS;

ABSTRACTION LEVEL; CHIP PROTECTIONS; CONCEPT ANALYSIS; ESD ANALYSIS; MIXED-SIGNAL DESIGN; SIMULATION AND ANALYSIS; SIMULATION APPROACH; TEST ROUTINES;

ELECTROSTATIC DEVICES;

EID: 84945232280     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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