Random program generator for Java JIT compiler test system

Proceedings - International Conference on Quality Software

Volumn 2003-January, Issue , 2003, Pages 20-23

  Yoshikawa, T ^a   Shimura, K ^a   Ozawa, T ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; JAVA PROGRAMMING LANGUAGE; JUST IN TIME PRODUCTION; SOFTWARE TESTING; TEST FACILITIES; TESTING;

CELLULAR PHONE; EXECUTION PROCESS; JAVA CLASS FILES; JAVA RUNTIME SYSTEMS; JIT COMPILER; RANDOM TESTS; TEST SYSTEMS; TEST TOOLS;

PROGRAM COMPILERS;

EID: 84945196370     PISSN: 15506002     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/QSIC.2003.1319081     Document Type: Conference Paper

References (9)

1. Sun Microsystems, TCK Development Guide version 1.0, http://jcp.org/aboutJava/communityprocess/tck/tck-guidelines-10-tr7, 2001.
2. Reservoir Labs, R-JVV-Random test generator for Java Virtual Machines, http://www.reservoir.com/r-jvv.php, 2002
3. Jon Meyer, http://www.cat.nyu.edu/~meyer/jasmin/, 1997.
4. Sun Microsystems, Java2 Platform, Micro Edition, http://java/sun/com/j2me, 2001
5. Sun Microsystems, Java2 Platform Standard Edition, http://java.sun.com/j2se, 2001.
6. F. Corno, G. Cumani, M. Sonza Reorda and G. Squillero, Automatic Test Program Generation from RT-level microprocessor descriptions, International Symposium on Quality Electronic Design, 2002.
7. K. Batcher, Instruction Randomization Self Test For Processor Cores, IEEE VLSI Test Symposium, 2000.
8. A. Krall, Efficient JavaVM just-in-time compilation, International Conference on Parallel Architectures and Compilation Techniques, 1998.
9. Ali-Reza Adl-Tabatabai, Micha Cierniak, Guei-Yuan Lueh, Vishesh M. Parikh and James M. Stichnoth, Fast, effective code generation in a just-in-time Java compiler, ACM conference on Programming language design and