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RSC Advances

Volumn 5, Issue 93, 2015, Pages 75953-75963

Exploiting XPS for the identification of sulfides and polysulfides

(5) Fantauzzi, Marzia a,b Elsener, Bernhard a,b,c Atzei, Davide a,b Rigoldi, Americo a,b Rossi, Antonella a,b

a UNIVERSITY OF CAGLIARI (Italy)

b INSTM UdR Cagliari (Italy)

c ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; BINDING ENERGY; CHAINS; CURVE FITTING; PHOTOELECTRON SPECTROSCOPY; SULFUR; SULFUR COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

BINDING ENERGY SHIFTS; FINAL-STATE EFFECTS; INITIAL-STATE EFFECTS; KLL AUGER SPECTRA; MINERAL SULFIDES; PHOTOELECTRON SPECTRUM; SULFUR SPECIATION; TERMINAL POSITION;

POLYSULFIDES;

EID: 84941578371 PISSN: None EISSN: 20462069 Source Type: Journal
DOI: 10.1039/c5ra14915k Document Type: Article

Times cited : (391)

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