Ultrafast visualization of crystallization and grain growth in shock-compressed SiO2

Nature Communications

Volumn 6, Issue , 2015, Pages

  Gleason, A E ^a,b   Bolme, C A ^a   Lee, H J ^b   Nagler, B ^b   Galtier, E ^b   Milathianaki, D ^b   Hawreliak, J ^c   Kraus, R G ^d   Eggert, J H ^d   Fratanduono, D E ^d   Collins, G W ^d   Sandberg, R ^a   Yang, W ^e,f   Mao, W L ^b,g  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c WASHINGTON STATE UNIVERSITY   (United States)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^e HPSynC   (United States)

^f CENTER FOR HIGH PRESSURE SCIENCE AND TECHNOLOGY ADVANCED RESEARCH   (China)

^g STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

CRYSTALLIZATION; HIGH PRESSURE; HIGH TEMPERATURE; NUCLEATION; PHASE TRANSITION; SILICA; SILICON; VISUALIZATION; X-RAY DIFFRACTION;

ARTICLE; COMPRESSION; CRYSTALLIZATION; DIFFRACTION; GRAIN; KINETICS; PHASE TRANSITION; PLANT GROWTH; PRESSURE; SHOCK WAVE; X RAY DIFFRACTION;

EID: 84941000554     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms9191     Document Type: Article

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