Measurement of the conductivity exponent in random percolating networks of nanoscale bismuth clusters

Proceedings - International Conference on MEMS, NANO and Smart Systems, ICMENS 2003

Volumn , Issue , 2003, Pages 350-356

  Dunbar, A D F ^a   Partridge, J G ^a   Schulze, M ^a   Scott, S ^a   Brown, S A ^a  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

Author keywords

Assembly; Atomic layer deposition; Bismuth; Conductivity measurement; Contacts; Extraterrestrial measurements; Fabrication; Intelligent networks; Lattices; Nanowires

Indexed keywords

ASSEMBLY; ATOMIC LAYER DEPOSITION; CONTACTS (FLUID MECHANICS); CRYSTAL LATTICES; FABRICATION; INTELLIGENT NETWORKS; NANOTECHNOLOGY; NANOWIRES; PERCOLATION (COMPUTER STORAGE); SOLVENTS;

CONDUCTIVITY EXPONENTS; CONDUCTIVITY MEASUREMENTS; CONTINUUM PERCOLATION; ELECTRICAL CONTACTS; ELECTRICAL MEASUREMENT; EXTRATERRESTRIAL MEASUREMENTS; GAS AGGREGATION; PERCOLATING NETWORKS;

BISMUTH;

EID: 84939566055     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMENS.2003.1222023     Document Type: Conference Paper

References (21)

1. S. Feng, B. I. Halperin and P. N. Sen, "Transport properties of continuum systems near the percolation threshold", Phys. Rev. B, Vol. 35 No. 1, 1987, pp. 197-214.
2. K. Meiwes-Broer (editor), Metal Clusters at Surfaces, Springer, Berlin, 2000
3. P. Milani and S. Ianotta (editors), Cluster Beam Synthesis of Nanostructured Materials, Springer, Berlin, 1999.
4. F. Favier, et al., "Hydrogen sensors and switches from electrodeposited palladium mesowire arrays", Science, Vol. 293, 2001, pp. 2227-2231.
5. S. J. Tans, A. R. M. Verschueren and C. Dekker, "Room-temperature transistor based on a single carbon nanotube", Nature, Vol. 393, 7 May 1998, pp. 49-52
6. K. Stattler (editor), Cluster Assembled Materials, Trans Tech Publications, Zurich, 1996.
7. J. Schmelzer Jr., et al., "Finite-size effects in the conductivity of cluster assembled nanostructures", Phys. Rev. Lett. Vol. 88 No. 22, 2002, 226802 pp. 1-4.
8. D. Stauffer, Introduction to Percolation Theory, Taylor and Francis, London, 1985.
9. H. E. Stanley, "Scaling, universality, and renormalization: Three pillars of modern critical phenomena", Rev. Mod. Phys., Vol. 71 No. 2, 1999, pp. S358-S366.
10. M. E. J. Newman and R. M. Ziff, "Efficient Monte Carlo algorithm and high-precision results for percolation", Phys. Rev. Lett., Vol. 85 No. 19, 2000, pp. 4104-4107.
11. J. Quintanilla, S. Torquato and R. M. Ziff, "Efficient measurement of the percolation threshold for fully penetrable discs", J. Phys. A: Math. Gen., Vol. 33, 2000, pp. L399-L407.
12. D. R. Baker, et al., " Continuum percolation threshold for interpenetrating squares and cubes", Phys. Rev. E, Vol. 66, 2002, 046136, pp. 1-5.
13. M. D. Rintoul and S. Torquato, "Precise determination of the critical threshold and exponents in a three dimensional continuum percolation model", J. Phys. A: Math. Gen., Vol. 30, 1997, pp. L585-L592.
14. B. I. Halperin, S. Feng and P. N. Sen, "Differences between lattice and continuum percolation transport exponents", Phys. Rev. Lett. Vol. 54 No. 22, 1985, pp. 2391-2394.
15. I. Balberg, "Limits on the continuum-percolation transport exponents", Phys. Rev. B, Vol. 57 No. 21, 1998, pp. 13351-13354.
16. L. N. Smith and C. J. Lobb, "Percolation in two-dimensional conductor-insulator networks with controllable anisotropy", Phys. Rev. B, Vol. 20 No. 9, 1979, pp. 3653-3658.
17. M. A. Dubson and J. C. Garland, "Measurement of the conductivity exponent in two-dimensional percolating networks: Square lattice versus ramdon-void continuum", Phys. Rev. B, Vol. 32 No. 11, 1985, pp. 7621-7623.
18. A. Okazaki, et al., "Experimental study of critical exponents of electrical conductivity in a two-dimensional continuum percolation system", Phys. Rev. E, Vol. 61 No. 6, 2000, pp. 6215-6218.
19. S. Yamamuro, et al., "Size dependent nonuniversal conductivity in nanometer-size Co cluster assemblies", J. Phys. Soc, Japan, Vol. 68 No. 1, 1999, pp. 28-31.
20. P. Melinon, et al., "Comparison of molecular and cluster deposition: Evidence of different percolation processes", Phys. Rev. B, Vol. 44 No. 22, 1991, pp. 12562-12564.
21. M. Shulze, et al., "Electrical measurements of nanoscale bismuth cluster films", to be published in Eur. Phys. J. D, 2003.