Diagnostics of wall paintings: A smart and reliable approach

Journal of Cultural Heritage

Volumn 18, Issue , 2016, Pages 229-241

  Sfarra, Stefano ^a   Ibarra Castanedo, Clemente ^b   Tortora, Mariagrazia ^a   Arrizza, Lorenzo ^a   Cerichelli, Giorgio ^a   Nardi, Iole ^a   Maldague, Xavier ^b  

^a UNIVERSITY OF L'AQUILA   (Italy)

^b UNIVERSITÉ LAVAL   (Canada)

Author keywords

Defect; Electronic speckle pattern interferometry; Energy dispersive X ray spectroscopy; Fourier transform infrared spectroscopy; Infrared thermography; Mural painting; Near infrared reflectography; Scanning electron microscope; Ultraviolet imaging; Raman spectroscopy

Indexed keywords

EID: 84939218583     PISSN: 12962074     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.culher.2015.07.011     Document Type: Article

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