Discovering the defects in paintings using non-destructive testing (NDT) techniques and passing through measurements of deformation

Journal of Nondestructive Evaluation

Volumn 33, Issue 3, 2014, Pages 358-383

  Sfarra, S ^a   Ibarra Castanedo, C ^b   Ambrosini, D ^a   Paoletti, D ^a   Bendada, A ^b   Maldague, X ^b  

^a UNIVERSITY OF L'AQUILA   (Italy)

^b UNIVERSITÉ LAVAL   (Canada)

Author keywords

Defects; Deformations; Digital speckle photography; Holographic interferometry; Paintings; Square pulse thermography

Indexed keywords

CMOS INTEGRATED CIRCUITS; DEFECTS; DEFORMATION; HOLOGRAPHIC INTERFEROMETRY; MATHEMATICAL MODELS; PAINTING; PHOTOGRAPHY; SPECKLE; STRAIN; STRETCHERS;

DIGITAL SPECKLE PHOTOGRAPHY; LASER SPECKLE IMAGING; MECHANICAL CONTACT; NARROW BAND FILTER; NON DESTRUCTIVE TESTING; OPTICAL TECHNIQUE; SHARP TRANSITION; SQUARE PULSE THERMOGRAPHY;

NONDESTRUCTIVE EXAMINATION;

EID: 84906781771     PISSN: 01959298     EISSN: 15734862     Source Type: Journal    
DOI: 10.1007/s10921-013-0223-7     Document Type: Article

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