Elements Provide a Clue: Nanoscale Characterization of Thin-Film Composite Polyamide Membranes

ACS Applied Materials and Interfaces

Volumn 7, Issue 31, 2015, Pages 16917-16922

  Lu, Xinglin ^a   Nejati, Siamak ^b   Choo, Youngwoo ^b   Osuji, Chinedum O ^b   Ma, Jun ^a   Elimelech, Menachem ^b  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b Yale University   (United States)

Author keywords

elemental contrast; nanoscale characterization; polyamide polysulfone interface; thin film composite membrane

Indexed keywords

CHARACTERIZATION; CHEMICAL ANALYSIS; COMPOSITE MEMBRANES; ENERGY DISPERSIVE SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); ION BEAMS; NANOCOMPOSITE FILMS; NANOTECHNOLOGY; POLYAMIDES; SCANNING ELECTRON MICROSCOPY; SPUTTERING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

CHEMICAL COMPOSITIONS; ELEMENTAL CONTRAST; ENERGY DISPERSIVE X RAY SPECTROSCOPY; IMPLICATIONS FOR FUTURES; NANOSCALE CHARACTERIZATION; NANOSCALE RESOLUTIONS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THIN FILM COMPOSITE MEMBRANES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84939135825     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/acsami.5b05478     Document Type: Article

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