An on-chip electrical transport spectroscopy approach for in situ monitoring electrochemical interfaces

Nature Communications

Volumn 6, Issue , 2015, Pages

  Ding, Mengning ^a,b   He, Qiyuan ^b   Wang, Gongming ^b   Cheng, Hung Chieh ^a   Huang, Yu ^a,b   Duan, Xiangfeng ^b  

^a Engineering IV   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FORMIC ACID; METHANOL; PLATINUM NANOPARTICLE;

CATALYST; ELECTRICAL PROPERTY; ELECTROCHEMICAL METHOD; ELECTROCHEMISTRY; ELECTRODE; ELECTRON; ELECTRONIC EQUIPMENT; IN SITU MEASUREMENT; NANOTECHNOLOGY; OPTIMIZATION; PLATINUM; SENSITIVITY ANALYSIS; SPECTROSCOPY;

ARTICLE; CONDUCTANCE; CYCLIC POTENTIOMETRY; ELECTRIC POTENTIAL; ELECTRICAL PARAMETERS; ELECTROCHEMICAL ANALYSIS; ELECTROCHEMISTRY; ELECTRODE; INDUCED RESISTANCE; MOLECULAR ELECTRONICS; NANOCATALYST; NANOFABRICATION; ON CHIP ELECTRICAL TRANSPORT SPECTROSCOPY; OXIDATION; SCANNING ELECTRON MICROSCOPY; SENSITIVITY AND SPECIFICITY; SPECTROSCOPY; SURFACE PROPERTY;

EID: 84938818769     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms8867     Document Type: Article

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