3D-stackable crossbar resistive memory based on Field Assisted Superlinear Threshold (FAST) selector

Technical Digest - International Electron Devices Meeting, IEDM

Volumn 2015-February, Issue February, 2015, Pages 6.7.1-6.7.4

  Jo, Sung Hyun ^a   Kumar, Tanmay ^a   Narayanan, Sundar ^a   Lu, Wei D ^a   Nazarian, Hagop ^a  

^a Crossbar Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DEVICES; FIRE FIGHTING EQUIPMENT; PROCESSING; RANDOM ACCESS STORAGE;

CROSS-BAR MEMORY; CROSSBAR ARRAYS; HIGH DENSITY MEMORY; ON/OFF RATIO; PROCESSING TEMPERATURE; RESISTIVE MEMORY; SNEAK CURRENTS; SUPERLINEAR;

THREE DIMENSIONAL INTEGRATED CIRCUITS;

EID: 84938266942     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2014.7046999     Document Type: Conference Paper

References (4)

1. A. Kawahara et al., IEEE ISSCC, 25.6, 2012
2. W. Lee et al., VLSI Tech. Symp., 37-38, 2012
3. K. Virwani et al., IEDM, 36-39, 2012
4. S. Kim et al., VLSI Tech. Symp., T240-241, 2013