Understanding inherent qualities of evolved circuits: Evolutionary history as a predictor of fault tolerance

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 1801, Issue , 2000, Pages 133-144

  Layzell, Paul ^a   Thompson, Adrian ^a  

^a UNIVERSITY OF SUSSEX   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGY; TIMING CIRCUITS;

ARTIFICIAL EVOLUTION; BEHAVIOURAL SPECIFICATIONS; CONVENTIONAL TECHNIQUES; DESIGN PROCESS; EVOLUTIONARY APPROACH; EVOLUTIONARY DESIGN PROCESS; EVOLUTIONARY HISTORY;

FAULT TOLERANCE;

EID: 84937407586     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-46406-9_14     Document Type: Conference Paper

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