Estimation of lattice strain in ZnO nanoparticles: X-ray peak profile analysis

Journal of Theoretical and Applied Physics

Volumn 8, Issue 4, 2014, Pages 123-134

  Bindu, P ^a   Thomas, Sabu ^a  

^a MAHATMA GANDHI UNIVERSITY   (India)

Author keywords

Nanostructured materials; Photoluminescence emission; SEM; TEM; X ray diffraction; ZnO nanoparticles

Indexed keywords

EID: 84937040920     PISSN: 22517227     EISSN: 22517235     Source Type: Journal    
DOI: 10.1007/s40094-014-0141-9     Document Type: Article

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