X-ray peak broadening analysis in ZnO nanoparticles

Solid State Communications

Volumn 149, Issue 43-44, 2009, Pages 1919-1923

  Yogamalar, Rajeswari ^a   Srinivasan, Ramasamy ^a   Vinu, Ajayan ^b   Ariga, Katsuhiko ^b   Bose, Arumugam Chandra ^a  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

A. Semiconductor; B. Chemical synthesis; C. Crystal structure; C. Dislocation

Indexed keywords

A. SEMICONDUCTOR; ANISOTROPIC CRYSTALS; B. CHEMICAL SYNTHESIS; C. CRYSTAL STRUCTURE; C. DISLOCATION; ENERGY DENSITY; HEXAGONAL PHASE; HEXAGONAL WURTZITE; HYDROTHERMAL PROCESS; INTERPLANAR SPACINGS; LATTICE STRAIN; MEAN PARTICLE SIZE; NANO-STRUCTURED; PEAK BROADENING; PHYSICAL PARAMETERS; REFLECTION PEAKS; ROD-SHAPED; ROOT MEAN SQUARE; TEM; TEM ANALYSIS; UNIFORM DEFORMATION; UNIFORM STRESS; WILLIAMSON-HALL; WURTZITES; X RAY PEAK BROADENING; XRD; ZNO; ZNO NANOPARTICLES;

ANISOTROPY; ASPECT RATIO; CHEMICAL ANALYSIS; CRYSTALLITES; DEFORMATION; DISLOCATIONS (CRYSTALS); NANOPARTICLES; PARTICLE SIZE; PARTICLE SIZE ANALYSIS; SEMICONDUCTING ZINC COMPOUNDS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC OXIDE; ZINC SULFIDE;

CRYSTAL STRUCTURE;

EID: 70349398785     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2009.07.043     Document Type: Article

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