SCOPUS 정보 검색 플랫폼

Lab on a Chip

Volumn 15, Issue 14, 2015, Pages 2923-2927

Fast electrically assisted regeneration of on-chip SERS substrates

(8) Meier, T A a Poehler, E a Kemper, F b Pabst, O b Jahnke, H G a Beckert, E b Robitzki, A a Belder, D a

a UNIVERSITY OF LEIPZIG (Germany)

b FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

METAL NANOPARTICLE; SILVER;

CHEMISTRY; DEVICES; ELECTRICITY; MICROFLUIDIC ANALYSIS; PRINTING; RAMAN SPECTROMETRY; SURFACE PROPERTY;

ELECTRICITY; METAL NANOPARTICLES; MICROFLUIDIC ANALYTICAL TECHNIQUES; PRINTING; SILVER; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 84934296581 PISSN: 14730197 EISSN: 14730189 Source Type: Journal
DOI: 10.1039/c5lc00397k Document Type: Article

Times cited : (33)

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