Defect depth quantification using lock-in thermography

Quantitative InfraRed Thermography Journal

Volumn 12, Issue 1, 2015, Pages 37-52

  Delanthabettu, Sharath ^a   Menaka, Murugesan ^a   Venkatraman, Balasubramanian ^a   Raj, Baldev ^b  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^b NATIONAL INSTITUTE OF ADVANCED STUDIES   (India)

Author keywords

blind frequency; defect depth; lock in thermography; phase contrast

Indexed keywords

AUSTENITIC STAINLESS STEEL; LOCKS (FASTENERS); STAINLESS STEEL; THERMOGRAPHY (IMAGING); THERMOGRAPHY (TEMPERATURE MEASUREMENT);

BLIND FREQUENCY; DEFECT DEPTH; DEFECT DEPTH QUANTIFICATIONS; LOCKIN THERMOGRAPHY; MODULATION FREQUENCIES; ONE DIMENSIONAL ANALYTICAL MODEL; PHASE CONTRAST METHOD; PHASE CONTRASTS;

DEFECTS;

EID: 84931577027     PISSN: 17686733     EISSN: 21167176     Source Type: Journal    
DOI: 10.1080/17686733.2015.1013663     Document Type: Article

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