Defect depth retrieval from pulsed phase thermographic data on plexiglas and aluminum samples

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5405, Issue , 2004, Pages 348-356

  Ibarra Castanedo, C ^a   Maldague, X ^a  

^a UNIVERSITÉ LAVAL   (Canada)

Author keywords

Blind Frequency; Phase Contrast; Pulsed Phase Thermography; Time Aliasing; Truncation

Indexed keywords

CONDUCTIVE MATERIALS; DATA REDUCTION; DEFECTS; FOURIER TRANSFORMS; GLASS; IMAGE PROCESSING;

BLIND FREQUENCY; PHASE CONTRAST; PULSED PHASE THERMOGRAPHY; TIME ALIASING; TRUNCATION;

THERMOGRAPHY (IMAGING);

EID: 3543120609     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.540855     Document Type: Conference Paper

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