Controlling defects in graphene for optimizing the electrical properties of graphene nanodevices

ACS Nano

Volumn 9, Issue 4, 2015, Pages 3428-3435

  Vicarelli, Leonardo ^a   Heerema, Stephanie J ^a   Dekker, Cees ^a   Zandbergen, Henny W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; IN SITU PROCESSING; REPAIR; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

ELECTRICAL TRANSPORT PROPERTIES; IN-SITU EXPERIMENTS; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; NANO-DEVICES; SELF REPAIR; STRUCTURAL DEFECT;

GRAPHENE;

CARBON NANOTUBE; GRAPHITE;

GRAPHITE; NANOTUBES, CARBON;

EID: 84928978918     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/acsnano.5b01762     Document Type: Article

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