Energy dispersive x-ray spectroscopy for nanostructured thin film density evaluation

Science and Technology of Advanced Materials

Volumn 16, Issue 2, 2015, Pages

  Prencipe, Irene ^a   Dellasega, David ^a   Zani, Alessandro ^a,b   Rizzo, Daniele ^a   Passoni, Matteo ^a  

^a POLITECNICO DI MILANO   (Italy)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

areal density; density evaluation; EDS; foam; thin film

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; FOAMS; NONDESTRUCTIVE EXAMINATION; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

AREAL DENSITIES; DENSITY EVALUATION; ELECTRON MICROPROBES; ENERGY DISPERSIVE X RAY SPECTROSCOPY; MICROSCOPIC SCALE; NANOSTRUCTURED FILMS; NANOSTRUCTURED THIN FILM; NONDESTRUCTIVE METHODS;

X RAY SPECTROSCOPY;

EID: 84928644925     PISSN: 14686996     EISSN: None     Source Type: Journal    
DOI: 10.1088/1468-6996/16/2/025007     Document Type: Article

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