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Thin Solid Films

Volumn 582, Issue , 2015, Pages 56-59

Effects of NaF evaporation during low temperature Cu(In,Ga)Se2growth

(7) Bissig, B a Reinhard, P a Pianezzi, F a Hagendorfer, H a Nishiwaki, S a Buecheler, S a Tiwari, A N a

a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY (Switzerland)

Author keywords

Admittance spectroscopy; Alkali; Copper; ICP MS; Indium gallium selenide; Post deposition treatment; SIMS; Sodium

Indexed keywords

ACTIVATION ENERGY; COBALT COMPOUNDS; COPPER; COPPER COMPOUNDS; COPPER METALLOGRAPHY; DEPOSITION; EVAPORATION; GALLIUM COMPOUNDS; INDIUM METALLOGRAPHY; INFRARED DEVICES; LAYERED SEMICONDUCTORS; SECONDARY ION MASS SPECTROMETRY; SODIUM; SODIUM METALLOGRAPHY; TEMPERATURE;

ADMITTANCE SPECTROSCOPIES; ALKALI; GALLIUM SELENIDES; ICP-MS; POST DEPOSITION TREATMENT;

SODIUM COMPOUNDS;

EID: 84926435293 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2014.11.026 Document Type: Conference Paper

Times cited : (14)

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