Determination of diffusion coefficients from semiintegrated d.c. and a.c. voltammetric data: Overcoming the edge effect at macrodisc electrodes

Journal of Electroanalytical Chemistry

Volumn 744, Issue , 2015, Pages 110-116

  Simonov, Alexandr N ^a   Mashkina, Elena ^a   Mahon, Peter J ^c   Oldham, Keith B ^b   Bond, Alan M ^a  

^a MONASH UNIVERSITY   (Australia)

^b TRENT UNIVERSITY   (Canada)

^c SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

A.c. voltammetry; Convolution; D.c. voltammetry; Diffusion coefficient; Semiintegration

Indexed keywords

CONVOLUTION; ELECTRODES; VOLTAMMETRY;

APERIODIC COMPONENTS; DISC ELECTRODES; EDGE EFFECT; PLANAR DIFFUSIONS; SCAN RATES; SEMIINTEGRATION; VOLTAMMETRIC DATA; VOLTAMMOGRAMS;

DIFFUSION;

EID: 84925068107     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jelechem.2015.02.020     Document Type: Article

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