Elastic fields of interacting point defects within an ultra-thin fcc film bonded to a rigid substrate

Central European Journal of Engineering

Volumn 3, Issue 4, 2013, Pages 707-721

  Shodja, Hossein M ^a   Tabatabaei, Maryam ^a   Ostadhossein, Alireza ^b   Pahlevani, Ladan ^a  

^a SHARIF UNIVERSITY OF TECHNOLOGY   (Iran)

^b The Pennsylvania State University   (United States)

Author keywords

Interacting point defects; Lattice statics method; Ultra thin fcc film

Indexed keywords

EID: 84921456269     PISSN: 18961541     EISSN: 20819927     Source Type: Journal    
DOI: 10.2478/s13531-013-0116-7     Document Type: Article

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