Multiwavelength excitation Raman scattering of Cu2ZnSn(SxSe1-x)4 (0 ≤ × ≤ 1) polycrystalline thin films: Vibrational properties of sulfoselenide solid solutions

Applied Physics Letters

Volumn 105, Issue 3, 2014, Pages

  Dimitrievska, Mirjana ^a   Xie, Haibing ^a   Fairbrother, Andrew ^a   Fontané, Xavier ^a   Gurieva, Galina ^b   Saucedo, Edgardo ^a   Pérez Rodríguez, Alejandro ^a,c   Schorr, Susan ^b,d   Izquierdo Roca, Victor ^a  

^a CATALONIA INSTITUTE FOR ENERGY RESEARCH IREC   (Spain)

^b HAHN MEITNER INSTITUT   (Germany)

^c UNIVERSITY OF BARCELONA   (Spain)

^d FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL STRUCTURE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION;

EXCITATION WAVELENGTH; EXPERIMENTAL SPECTRA; MULTIWAVELENGTH; PHONON MODE; PHOTOVOLTAIC; POLYCRYSTALLINE THIN FILM; RAMAN SCATTERING MEASUREMENTS; VIBRATIONAL PROPERTIES;

SOLID SOLUTIONS;

EID: 84921450279     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4891333     Document Type: Article

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