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Volumn 15, Issue 1, 2015, Pages 21-26

Quantum-dot size and thin-film dielectric constant: Precision measurement and disparity with simple models

Author keywords

capacitance; Dielectric constant; PbS; quantum dot; SAXS

Indexed keywords

CAPACITANCE; DISTRIBUTION FUNCTIONS; NANOCRYSTALS; PERMITTIVITY; THIN FILMS; X RAY SCATTERING;

EID: 84921064906     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl5024244     Document Type: Article
Times cited : (49)

References (33)
  • 2
    • 77956909895 scopus 로고
    • H. Ehrenreich, D. T. Seitz, F. Academic Press: Salt Lake City, UT, Vol
    • Dalven, R. In Solid State Physics; H. Ehrenreich, D. T., Seitz, F., Ed.; Academic Press: Salt Lake City, UT, 1973; Vol. 28; p 179.
    • (1973) Solid State Physics , vol.28 , pp. 179
    • Dalven, R.1
  • 32
    • 84921052164 scopus 로고    scopus 로고
    • Web Plot Digitizer. (accessed Aug 2014)
    • Rohatgi, A. Web Plot Digitizer. http://arohatgi.info/WebPlotDigitizer/ (accessed Aug 2014).
    • Rohatgi, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.