Quantification of phase content in TiO2 thin films by Raman spectroscopy

Superficies y Vacio

Volumn 27, Issue 3, 2014, Pages 88-92

  Castrejon Sanchez V H ^a,b,c   Camps, Enrique ^c   Camacho Lopez M ^a  

^a UNIVERSIDAD AUTÓNOMA DEL ESTADO DE MÉXICO   (Mexico)

^b Instituto de Estudios Superiores de Jocotitlán   (Mexico)

^c INSTITUTO NACIONAL DE INVESTIGACIONES NUCLEARES   (Mexico)

Author keywords

Anatase rutile TiO2; Raman spectroscopy; Reactive sputtering

Indexed keywords

EID: 84920719631     PISSN: 16653521     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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