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Volumn , Issue , 2009, Pages

Identifying optimal prognostic parameters from data: A genetic algorithms approach

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FAILURE ANALYSIS; SYSTEMS ENGINEERING;

EID: 84920614020     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (115)

References (15)
  • 1
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    • On-line reliability estimation of individual components, using degradation signals
    • Dec
    • (Chinnam, 1999) Chinnam, R.B., "On-line Reliability Estimation of Individual Components, Using Degradation Signals", IEEE Transactions on Reliability, Vol 48, No 4, Dec 1999, pp. 403-412.
    • (1999) IEEE Transactions on Reliability , vol.48 , Issue.4 , pp. 403-412
    • Chinnam, R.B.1
  • 4
    • 84892400970 scopus 로고    scopus 로고
    • Reliability prediction using degradation data-A preliminary study using neural network-based approach
    • Maastricht, The Netherlands, Jun. 15-18
    • (Girish et al, 2003) Girish, T., S.W. Lam, J.S.R. Jayaram, "Reliability Prediction Using Degradation Data-A Preliminary Study Using Neural Network-based Approach," Proc. European Safety and Reliability Conference (ESREL 2003), Maastricht, The Netherlands, Jun. 15-18, 2003.
    • (2003) Proc. European Safety and Reliability Conference (ESREL 2003)
    • Girish, T.1    Lam, S.W.2    Jayaram, J.S.R.3
  • 5
    • 85134856905 scopus 로고    scopus 로고
    • John Wiley & Sons Ltd, Hoboken, New Jersey
    • (Haupt and Haupt, 2004) Haupt and Haupt. Practical Genetic Algorithms, John Wiley & Sons Ltd, Hoboken, New Jersey: 2004.
    • (2004) Practical Genetic Algorithms
    • Haupt1    Haupt2
  • 9
    • 0027595086 scopus 로고
    • Using degradation measures to estimate a time-to-failure distribution
    • May
    • (Lu and Meeker, 1993) Lu, C.J. and W.Q. Meeker, "Using Degradation Measures to Estimate a Time-to-Failure Distribution," Technometrics, Vol 35, No 2, May 1993, pp. 161-174.
    • (1993) Technometrics , vol.35 , Issue.2 , pp. 161-174
    • Lu, C.J.1    Meeker, W.Q.2
  • 10
    • 0032071686 scopus 로고    scopus 로고
    • Accelerated degradation tests: Modeling and analysis
    • (Meeker et al, 1998) Meeker, W.Q., L.A. Escobar, and C.J. Lu, "Accelerated degradation tests: modeling and analysis," Technometrics, vol. 40, no. 2, pp. 89-99, 1998.
    • (1998) Technometrics , vol.40 , Issue.2 , pp. 89-99
    • Meeker, W.Q.1    Escobar, L.A.2    Lu, C.J.3
  • 11
    • 0034575758 scopus 로고    scopus 로고
    • Bayesian methods for a growth-curve degradation model with repeated measures
    • (Robinson and Crowder, 2000) Robinson, M.E. and M.T. Crowder, "Bayesian Methods for a Growth-Curve Degradation Model with Repeated Measures," Lifetime Data Analysis, Vol 6, 2000, pp. 357-374.
    • (2000) Lifetime Data Analysis , vol.6 , pp. 357-374
    • Robinson, M.E.1    Crowder, M.T.2
  • 12
    • 72749104699 scopus 로고    scopus 로고
    • Prognostics challenge competition summary: Damage propagation modeling for aircraft engine run-to-failure simulation
    • Denver CO, Oct 6-9
    • (Saxena et al, 2008) Saxena, A., K. Goebel, D. Simon, N. Eklund, "Prognostics Challenge Competition Summary: Damage Propagation Modeling for Aircraft Engine Run-to-Failure Simulation," PHM '08, Denver CO, Oct 6-9, 2008.
    • (2008) PHM '08
    • Saxena, A.1    Goebel, K.2    Simon, D.3    Eklund, N.4
  • 14
    • 0000090155 scopus 로고    scopus 로고
    • Sequential tests of statistical hypotheses
    • (Wald, 1945) Wald, A. "Sequential Tests of Statistical Hypotheses." Annals of Mathematical Statistics 16 (2): 117-186.
    • Annals of Mathematical Statistics , vol.16 , Issue.2 , pp. 117-186
    • Wald, A.1
  • 15
    • 2342569509 scopus 로고    scopus 로고
    • Reliability prediction based on degradation modeling for systems with multiple degradation measures
    • (Wang and Coit, 2004) Wang, P. and D.W. Coit, "Reliability Prediction based on Degradation Modeling for Systems with Multiple Degradation Measures," Proc. of the 2004 Reliability and Maintainability Symposium, 2004, pp. 302-307.
    • (2004) Proc. of the 2004 Reliability and Maintainability Symposium , pp. 302-307
    • Wang, P.1    Coit, D.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.