Influence of Al2O3/SiO2 ratio on the microstructure and properties of low temperature co-fired CaO–Al2O3–SiO2 based ceramics

Journal of Materials Science: Materials in Electronics

Volumn 25, Issue 10, 2014, Pages 4206-4211

  Qing, Zhenjun ^a   Li, Bo ^a   Li, Hao ^a   Li, Yingxiang ^a   Zhang, Shuren ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; BENDING STRENGTH; CALCIUM OXIDE; CRYSTALS; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; FELDSPAR; LOW-K DIELECTRIC; MICROELECTRONICS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON; SINTERING; TEMPERATURE; THERMAL EXPANSION;

LOW COEFFICIENT OF THERMAL EXPANSIONS; LOW DIELECTRIC CONSTANTS; LOW DIELECTRIC LOSS; LOW SINTERING TEMPERATURE; LOW TEMPERATURE CO-FIRED CERAMICS; MECHANICAL AND DIELECTRIC PROPERTIES; MICROSTRUCTURE AND PROPERTIES; SECONDARY CRYSTALS;

ALUMINUM OXIDE;

EID: 84920252229     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-014-2150-5     Document Type: Article

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