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Volumn , Issue , 2005, Pages 25-28
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High speed fringe reflection technique for nm resolution topometry of diamond turned free form mirrors
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Author keywords
[No Author keywords available]
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Indexed keywords
COST EFFECTIVENESS;
SURFACE MEASUREMENT;
FREE-FORM SURFACE;
FRINGE PROJECTION;
FRINGE REFLECTIONS;
HIGH RESOLUTION;
LATERAL RESOLUTION;
MEASURING POINTS;
NANOMETER RESOLUTIONS;
VERTICAL RESOLUTION;
PRECISION ENGINEERING;
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EID: 84919951342
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (4)
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