Evaluation methods for gradient measurement techniques

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5457, Issue , 2004, Pages 300-311

  Li, Wansong ^a,b   Bothe, Thorsten ^a,b   Von Kopylow, Christoph ^a,b   Jüptner, Werner ^a,b  

^a Bremer Inst F Angew Strahltechnik   (Germany)

^b BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

Author keywords

3d shape measurement; Deflectometry; Fringe reflection; Gradient measurement; Shearography

Indexed keywords

3D SHAPE MEASUREMENT; DEFLECTOMETRY; FRINGE REFLECTION; GRADIENT MEASUREMENT; SHEAROGRAPHY;

DATA PROCESSING; DEFORMATION; OPTIMIZATION; POTENTIAL ENERGY; VISUALIZATION; WAVEFRONTS;

REFLECTION;

EID: 10044298374     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.546002     Document Type: Conference Paper

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