The 10th annual MLSP competition: Third place

IEEE International Workshop on Machine Learning for Signal Processing, MLSP

Volumn , Issue , 2014, Pages

  Koncevičius, Karolis ^a  

^a VILNIUS UNIVERSITY   (Lithuania)

Author keywords

Classification; Distance Weighted Discrimination; MRI; Schizophrenia

Indexed keywords

CLASSIFICATION (OF INFORMATION); MAGNETIC RESONANCE IMAGING;

DISTANCE WEIGHTED DISCRIMINATION; MULTIMODAL FEATURES; SCHIZOPHRENIA; THIRD PLACES;

DISEASES;

EID: 84912571753     PISSN: 21610363     EISSN: 21610371     Source Type: Conference Proceeding    
DOI: 10.1109/MLSP.2014.6958888     Document Type: Conference Paper

References (8)

1. Hallm Peter, J. S. Marron, and Amnon Neeman, "Geometric representation of high dimension, low sample size data," Journal of the Royal Statistical Society, Series B (Statistical Methodology), vol. 67, pp. 427-444, June 2005.
2. Šarunas Raudys and Anil K. Jain, "Small sample size effects in statistical pattern recognition: Recommendations for practitioners," IEEE Transactions on pattern analysis and machine intelligence, vol. 13, March 1991.
3. J. S. Marron, Michael Todd, and Jeongyoun Ahn, "Distance weighted discrimination," Journal of the American Statistical Association, vol. 102, pp. 1267-1271, 2007.
4. Jeongyoun Ahn and J. S. Marron, "The maximal data piling direction for discrimination," Biometrika, vol. 97, pp. 254-259, 2010.
5. R. A. Fisher, "The use of multiple measurements in taxonomic problems," Annals of Eugenics, vol. 7, pp. 179-188, 1936.
6. Hanwen Huang, Xiaosun Lu, Yufeng Liu, Perry Haaland, and J.S. Marron, "R/dwd: distance-weighted discrimination for classification, visualization and batch adjustment," Bioinformatics, vol. 28, pp. 1182-1183, April 2012.
7. UM Braga-Neto and ER Dougherty, "Is cross-validation valid for small-sample microarray classification?," Bioinformatics, vol. 20, pp. 374-380, 2004.
8. Trevor Hastie, Robert Tibshirani, and Jerome Friedman, The Elements of Statistical Learning, Springer Series in Statistics. Springer New York Inc., New York, NY, USA, 2001.