Photoelectron spectroscopy, and photovoltaic device study of Cu2ZnSnSe4 and ZnOxS1-x buffer layer interface

2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Volumn , Issue , 2014, Pages 847-851

  Steirer, K Xerxes ^a   Garris, Rebekah L ^a   Beall, Carolyn ^a   Kanevce, Ana ^a   Ramanathan, Kannan ^a   Repins, Ingrid ^a   Teeter, Glenn ^a   Perkins, Craig L ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

buffer; depth profile; kesterite; photoelectron spectroscopy; quaternary; SCAPS modeling; UPS; XPS; zinc oxysulfide

Indexed keywords

BUFFER LAYERS; CADMIUM SULFIDE; CADMIUM SULFIDE SOLAR CELLS; DEPOSITION; DEPTH PROFILING; ENERGY GAP; OPEN CIRCUIT VOLTAGE; OPTICAL WAVEGUIDES; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; SOLAR CELLS; THIN FILM DEVICES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE;

BUFFER; CHEMICAL-BATH DEPOSITION; CONDUCTION BAND OFFSET; KESTERITES; QUATERNARY; SPUTTER-DEPTH PROFILING; VALENCE-BAND MAXIMUMS; VALENCE-BAND-EDGE ENERGIES;

VALENCE BANDS;

EID: 84912060616     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2014.6925048     Document Type: Conference Paper

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