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Volumn , Issue , 2002, Pages 390-393

The diversity study of AES on FPGA application

Author keywords

AES; Diversity; Finite field; FPGA

Indexed keywords

FIELD PROGRAMMABLE GATE ARRAYS (FPGA); INTEGRATED CIRCUIT DESIGN;

EID: 84911413410     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FPT.2002.1188718     Document Type: Conference Paper
Times cited : (9)

References (7)
  • 3
    • 0035201257 scopus 로고    scopus 로고
    • Fault-based side-channel cryptanalysis tolerant rijndael symmetric block cipher architecture
    • Proceedings. 2001
    • R. Karri, Wu Kaijie, P. Mishra, Yongkook Kim, "Fault-based side-channel cryptanalysis tolerant rijndael symmetric block cipher architecture", Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001, pp. 418-426.
    • (2001) Defect and Fault Tolerance in VLSI Systems , pp. 418-426
    • Karri, R.1    Kaijie, W.2    Mishra, P.3    Kim, Y.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.