High-definition metrology enabled surface variation control by reducing cutter-spindle deflection

ASME 2014 International Manufacturing Science and Engineering Conference, MSEC 2014 Collocated with the JSME 2014 International Conference on Materials and Processing and the 42nd North American Manufacturing Research Conference

Volumn 1, Issue , 2014, Pages

  Nguyen, Hai Trong ^a   Wang, Hui ^b   Hu, S Jack ^c  

^a HANOI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Viet Nam)

^b FLORIDA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH DEFINITION; SURFACE VARIATIONS;

EID: 84908884839     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/MSEC2014-4017     Document Type: Conference Paper

References (17)

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