A wide field X-ray telescope for astronomical survey purposes: From theory to practice

Monthly Notices of the Royal Astronomical Society

Volumn 405, Issue 2, 2010, Pages 877-886

  Conconi, Paolo ^a   Campana, Sergio ^a   Tagliaferri, Gianpiero ^a   Pareschi, Giovanni ^a   Citterio, Oberto ^a   Cotroneo, Vincenzo ^a   Proserpio, Laura ^a   Civitani, Marta ^a  

^a INAF OSSERVATORIO ASTRONOMICO DI BRERA   (Italy)

Author keywords

Instrumentation: high angular resolution; Telescopes; X rays: general

Indexed keywords

ECONOMIC AND SOCIAL EFFECTS; MIRRORS; SURVEYS; TELESCOPES;

ASTRONOMICAL SURVEYS; INSTRUMENTATION:HIGH ANGULAR RESOLUTION; ON-AXIS; SPHERICAL ABERRATIONS; WIDE-FIELD; WOLTER I; X RAY MIRRORS; X RAY TELESCOPE; X-RAY GENERAL;

ABERRATIONS;

EID: 84908616156     PISSN: 00358711     EISSN: 13652966     Source Type: Journal    
DOI: 10.1111/j.1365-2966.2010.16513.x     Document Type: Article

References (27)

1. Burrows C. J., Burg R., Giacconi R., 1992, ApJ, 392, 760 (BBG)
2. Burrows D. N. et al., 2005, Space Sci. Rev., 120, 165
3. Cash W., Shealy D. L., Underwood J. H., 1979, Proc. SPIE, 184, 228
4. Chase R. C., VanSpeybroeck L. P., 1973, Applied Opt., 12, 1042
5. Citterio O., Campana S., Conconi P., Ghigo M., Mazzoleni F., Braeuninger H. W., Burkert W., Oppitz A., 1999, Proc. SPIE, 3766, 198
6. Conconi P., Campana S., 2001, A&A, 372, 1088 (CC)
7. Conconi P., Pareschi G., Campana S., Chincarini G., Tagliaferri G., 2004, Proc. SPIE, 5488, 334
8. DeLuca E. E., Weber M. A., Sette A. L., Golub L., Shibasaki K., Sakao T., Kano R., 2005, Advances Space Res., 36, 1489
9. Ghigo M., Citterio O., Mazzoleni F., Kolodziejczak J. J., O'Dell S., 1999, Proc. SPIE, 3766, 207
10. Giacconi R. et al., 2009, preprint (arXiv:0902.4857)
11. Harvey J. E., Thompson P. L., 1999, Proc. SPIE, 3766, 173
12. Hayford M. J., 1985, Proc. SPIE, 531, 68
13. Lemen J. R. et al., 2004, Proc. SPIE, 5171, 65
14. Mahajan V. N., 1981, J. Opt. Soc. America, 71, 1
15. Murray S. et al., 2009, preprint (arXiv:0903.5272)
16. Nariai K., 1987, Applied Opt., 26, 4428
17. Nariai K., 1988, Applied Opt., 27, 345
18. Pareschi G. et al., 2004, Proc SPIE, 5488, 481
19. Ptak A. et al., 2009, preprint (arXiv:0902.4239)
20. Thompson P. L., Harvey J. E., 2000, Opt. Eng., 39, 1677
21. Tsuneta S. et al., 1991, Sol. Phys., 136, 37
22. VanSpeybroeck L. P., Chase R. C., 1972, Applied Opt., 11, 440
23. Vikhlinin A. et al., 2009, preprint (arXiv:0903.5320)
24. Weisskopf M., Tananbaum H. D., Van Speybroeck L. P., O'Dell S. L., 2000, Proc. SPIE, 4012, 2
25. Werner W., 1977, Applied Opt., 16, 764
26. Wolter H., 1952a, Ann. Phys., 10, 94
27. Wolter H., 1952b, Ann. Phys., 10, 286