X-ray measurements of a prototype WFXT SiC mirror at the MSFC X-Ray calibration facility

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3766, Issue , 1999, Pages 207-220

  Ghigo, M ^a   Citterio, O ^a   Mazzoleni, F ^a   Kolodziejczak, J J ^a   O'Dell, S L ^a   Austin, R A ^a   Zirnstein, G ^a  

^a INAF OSSERVATORIO ASTRONOMICO DI BRERA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; OPTICAL DESIGN; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; OPTICS; SILICON CARBIDE; X RAYS;

HALF POWER DIAMETER; STRINGENT ANGULAR RESOLUTION; WIDE FIELD X RAY TELESCOPE; X RAY MEASUREMENT;

OPTICAL TELESCOPES;

EID: 0033318637     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)