-
2
-
-
84879088427
-
-
G. L. H. Tapley M. J. Silvero C. J. B. Alejo M. G. Béjar C. D. McTiernan M. Grenier J. C. N. Ferreira J. C. Scaiano J. Phys. Chem. C 2013 117 12279 12288
-
(2013)
J. Phys. Chem. C
, vol.117
, pp. 12279-12288
-
-
Tapley, G.L.H.1
Silvero, M.J.2
Alejo, C.J.B.3
Béjar, M.G.4
McTiernan, C.D.5
Grenier, M.6
Ferreira, J.C.N.7
Scaiano, J.C.8
-
8
-
-
36148990626
-
-
Q. X. Guo Z. J. Wu Z. B. Luo Q. Z. Liu J. L. Ye S. W. Luo L. F. Cun L. Z. Gong J. Am. Chem. Soc. 2007 129 13927 13938
-
(2007)
J. Am. Chem. Soc.
, vol.129
, pp. 13927-13938
-
-
Guo, Q.X.1
Wu, Z.J.2
Luo, Z.B.3
Liu, Q.Z.4
Ye, J.L.5
Luo, S.W.6
Cun, L.F.7
Gong, L.Z.8
-
28
-
-
80054852359
-
-
L. Chen, Y. Yuan, H. Peng, X. Lu, and Z. Luo, Mater. Lett., 2012, 67, 311 314
-
(2012)
Mater. Lett.
, vol.67
, pp. 311-314
-
-
Chen, L.1
Yuan, Y.2
Peng, H.3
Lu, X.4
Luo, Z.5
-
30
-
-
79953319431
-
-
K. P. Naidek F. Bianconi T. Costa R. da Rocha D. Zanchet J. A. Bonacin M. A. Novak M. d. G. F. Vaz H. Winnischofer J. Colloid Interface Sci. 2011 358 39 46
-
(2011)
J. Colloid Interface Sci.
, vol.358
, pp. 39-46
-
-
Naidek, K.P.1
Bianconi, F.2
Costa, T.3
Da Rocha, R.4
Zanchet, D.5
Bonacin, J.A.6
Novak, M.A.7
Vaz D. M, G.F.8
Winnischofer, H.9
-
31
-
-
84905456521
-
-
K. O. Abdulwahab M. A. Malik P. O'Brien G. A. Timco F. Tuna R. E. P. Winpenny R. A. D. Pattrick V. S. Cokerd E. Arenholze J. Mater. Chem. C 2014 2 6781 6789
-
(2014)
J. Mater. Chem. C
, vol.2
, pp. 6781-6789
-
-
Abdulwahab, K.O.1
Malik, M.A.2
O'Brien, P.3
Timco, G.A.4
Tuna, F.5
Winpenny, R.E.P.6
Pattrick, R.A.D.7
Cokerd, V.S.8
Arenholze, E.9
-
40
-
-
0003774587
-
-
in, ed. W. W. Wendlandt, Plenum Press, New York
-
H. G. Hecht, in Modern Aspect of Reflectance Spectroscopy, ed., W. W. Wendlandt, Plenum Press, New York, 1968
-
(1968)
Modern Aspect of Reflectance Spectroscopy
-
-
Hecht, H.G.1
-
41
-
-
77956503782
-
-
Bruker AXS Inc., Madison, WI
-
SAINT Plus, Bruker AXS Inc., Madison, WI, 2008
-
(2008)
SAINT Plus
-
-
-
42
-
-
84900548150
-
-
Bruker AXS Inc., Madison, WI
-
BRUKER AXS (v 6.14), Bruker AXS Inc., Madison, WI, 2008
-
(2008)
BRUKER AXS (V 6.14)
-
-
-
43
-
-
0003473687
-
-
Utrecht University, Utrecht, Netherland
-
A. L. Spek, PLATON, A Multipurpose Crystallographic Tool, Utrecht University, Utrecht, Netherland, 2002
-
(2002)
PLATON, A Multipurpose Crystallographic Tool
-
-
Spek, A.L.1
-
51
-
-
0036298704
-
-
K. I. Turte S. G. Shova V. M. Meriacre M. Gdaniec A. Yu J. Lipkowski J. Bartolome F. Wagner G. Filoti J. Struct. Chem. 2002 43 108 117
-
(2002)
J. Struct. Chem.
, vol.43
, pp. 108-117
-
-
Turte, K.I.1
Shova, S.G.2
Meriacre, V.M.3
Gdaniec, M.4
Yu, A.5
Lipkowski, J.6
Bartolome, J.7
Wagner, F.8
Filoti, G.9
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