Omnidirectional Near-Unity Absorption in an Ultrathin Planar Semiconductor Layer on a Metal Substrate

ACS Photonics

Volumn 1, Issue 9, 2014, Pages 812-821

  Park, Junghyun ^a   Kang, Ju Hyung ^a   Vasudev, Alok P ^a   Schoen, David T ^a   Kim, Hwi ^b   Hasman, Erez ^c   Brongersma, Mark L ^a  

^a STANFORD UNIVERSITY   (United States)

^b Korea University   (South Korea)

^c TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

critical coupling; optical absorption; perfect absorber; semiconductor; surface plasmon polariton

Indexed keywords

DISPERSION (WAVES); DISPERSIONS; ELECTROMAGNETIC WAVE ABSORPTION; ELECTROMAGNETIC WAVE POLARIZATION; GEOMETRY; GERMANIUM; LIGHT ABSORPTION; MODAL ANALYSIS; POLARIZATION; QUANTUM THEORY; SEMICONDUCTOR MATERIALS; SOLAR CELLS; SURFACE PLASMON RESONANCE; TRACKING (POSITION);

ABSORPTION PROPERTY; CRITICAL COUPLING; DISPERSION DIAGRAMS; PERFECT ABSORBER; PLANAR SEMICONDUCTORS; SURFACE PLASMON POLARITONS; TRANSVERSE ELECTRIC POLARIZATIONS; TRANSVERSE MAGNETIC;

LIGHT;

EID: 84908215095     PISSN: None     EISSN: 23304022     Source Type: Journal    
DOI: 10.1021/ph500093d     Document Type: Article

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