Edge perpendicular binary coding for USM sharpening detection

IEEE Signal Processing Letters

Volumn 22, Issue 3, 2015, Pages 327-331

  Ding, Feng ^a,b   Zhu, Guopu ^b   Yang, Jianquan ^b   Xie, Jin ^b   Shi, Yun Qing ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY   (China)

Author keywords

Image forensics; Overshoot artifact; Sharpening detection; Unsharp masking sharpening

Indexed keywords

BINARY CODES; DIGITAL FORENSICS;

BINARY CODING; IMAGE EDGE; IMAGE FORENSICS; IMAGE MANIPULATION; OVERSHOOT ARTIFACT; TEXTURE MODIFICATION; UNSHARP MASKING;

IMAGE TEXTURE;

EID: 84907967551     PISSN: 10709908     EISSN: None     Source Type: Journal    
DOI: 10.1109/LSP.2014.2359033     Document Type: Article

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