Unsharp masking sharpening detection via overshoot artifacts analysis

IEEE Signal Processing Letters

Volumn 18, Issue 10, 2011, Pages 603-606

  Cao, Gang ^a   Zhao, Yao ^a   Ni, Rongrong ^a   Kot, Alex C ^b  

^a BEIJING JIAOTONG UNIVERSITY   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Digital forensics; image sharpening; overshoot artifacts; unsharp masking

Indexed keywords

DIGITAL FORENSIC; DIGITAL IMAGE; IMAGE SHARPENING; OVERSHOOT ARTIFACTS; TEST RESULTS; UNIQUE FEATURES; UNSHARP MASKING;

PHOTOGRAPHY;

EID: 80052396955     PISSN: 10709908     EISSN: None     Source Type: Journal    
DOI: 10.1109/LSP.2011.2164791     Document Type: Article

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