In situ study of an oxidation reaction on a Pt/C electrode by ambient pressure hard X-ray photoelectron spectroscopy

Applied Physics Letters

Volumn 105, Issue 13, 2014, Pages

  Takagi, Yasumasa ^a,b   Wang, Heng ^a   Uemura, Yohei ^a,b   Ikenaga, Eiji ^c   Sekizawa, Oki ^d   Uruga, Tomoya ^c,d   Ohashi, Haruhiko ^c   Senba, Yasunori ^c   Yumoto, Hirokatsu ^c   Yamazaki, Hiroshi ^c   Goto, Shunji ^c   Tada, Mizuki ^e   Iwasawa, Yasuhiro ^d   Yokoyama, Toshihiko ^a,b  

^a INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^b GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^d UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^e NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT PRESSURES; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; IN-SITU STUDY; OXIDATION REACTIONS; PT/C ELECTRODES;

EID: 84907726973     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4897007     Document Type: Article

References (24)

1. N. Ishiguro, T. Saida, T. Uruga, S. Nagamatsu, O. Sekizawa, K. Nitta, T. Yamamoto, S. Ohkoshi, Y. Iwasawa, T. Yokoyama, and M. Tada, ACS Catal. 2, 1319 (2012). 10.1021/cs300228p
2. T. Saida, O. Sekizawa, N. Ishiguro, M. Hoshino, K. Uesugi, T. Uruga, S. Ohkoshi, T. Yokoyama, and M. Tada, Angew. Chem. Int. Ed. Engl. 51, 10311 (2012). 10.1002/anie.201204478
3. S. Nagamatsu, T. Arai, M. Yamamoto, T. Ohkura, H. Oyanagi, T. Ishizaka, H. Kawanami, T. Uruga, M. Tada, and Y. Iwasawa, J. Phys. Chem. C 117, 13094 (2013). 10.1021/jp402438e
4. H. Niwa, H. Kiuchi, J. Miyawaki, Y. Harada, M. Oshima, Y. Nabae, and T. Aoki, Electrochem. Commun. 35, 57 (2013). 10.1016/j.elecom.2013.08.003
5. H. S. Casalongue, S. Kaya, V. Viswanathan, D. J. Miller, D. Friebel, H. A. Hansen, J. K. Nørskov, A. Nilsson, and H. Ogasawara, Nat. Commun. 4, 2817 (2013). 10.1038/ncomms3817
6. H. G. S. Casalongue, M. L. Ng, S. Kaya, D. Friebel, H. Ogasawara, and A. Nilsson, Angew. Chem. Int. Ed. Engl. 53, 7169 (2014). 10.1002/anie.201402311
7. H. Siegbahn and K. Siegbahn, J. Electron Spectrosc. Relat. Phenom. 2, 319 (1973). 10.1016/0368-2048(73)80023-4
8. D. F. Ogletree, H. Bluhm, G. Lebedev, C. S. Fadley, Z. Hussain, and M. Salmeron, Rev. Sci. Instrum. 73, 3872 (2002). 10.1063/1.1512336
9. J. Pantförder, S. Pöllmann, J. F. Zhu, D. Borgmann, R. Denecke, and H.-P. Steinrück, Rev. Sci. Instrum. 76, 014102 (2005). 10.1063/1.1824351
10. M. Salmeron and R. Schlögl, Surf. Sci. Rep. 63, 169 (2008). 10.1016/j.surfrep.2008.01.001
11. D. F. Ogletree, H. Bluhm, E. D. Hebenstreit, and M. Salmeron, Nucl. Instrum. Methods Phys. Res. Sect. A 601, 151 (2009). 10.1016/j.nima.2008.12.155
12. H. Bluhm, J. Electron Spectrosc. Relat. Phenom. 177, 71 (2010). 10.1016/j.elspec.2009.08.006
13. T. Shimada, B. S. Mun, I. F. Nakai, A. Banno, H. Abe, Y. Iwasawa, T. Ohta, and H. Kondoh, J. Phys. Chem. C 114, 17030 (2010). 10.1021/jp102777j
14. M. E. Grass, P. G. Karlsson, F. Aksoy, M. Lundqvist, B. Wannberg, B. S. Mun, Z. Hussain, and Z. Liu, Rev. Sci. Instrum. 81, 053106 (2010). 10.1063/1.3427218
15. Y. Takata, M. Yabashi, K. Tamasaku, Y. Nishino, D. Miwa, T. Ishikawa, E. Ikenaga, K. Horiba, S. Shin, M. Arita, K. Shimada, H. Namatame, M. Taniguchi, H. Nohira, T. Hattori, S. Södergren, B. Wannberg, and K. Kobayashi, Nucl. Instrum. Methods Phys. Res. Sect. A 547, 50 (2005). 10.1016/j.nima.2005.05.011
16. K. Kobayashi, Nucl. Instrum. Methods Phys. Res. Sect. A 601, 32 (2009). 10.1016/j.nima.2008.12.188
17. E. Ikenaga, M. Kobata, H. Matsuda, T. Sugiyama, H. Daimon, and K. Kobayashi, J. Electron Spectrosc. Relat. Phenom. 190, 180 (2013). 10.1016/j.elspec.2013.04.004
18. O. Sekizawa, T. Uruga, M. Tada, K. Nitta, K. Kato, H. Tanida, K. Takeshita, S. Takahashi, M. Sano, H. Aoyagi, A. Watanabe, N. Nariyama, H. Ohashi, H. Yumoto, T. Koyama, Y. Senba, T. Takeuchi, Y. Furukawa, T. Ohata, T. Matsushita, Y. Ishizawa, T. Kudo, H. Kimura, H. Yamazaki, T. Tanaka, T. Bizen, T. Seike, S. Goto, H. Ohno, M. Takata, H. Kitamura, T. Ishikawa, T. Yokoyama, and Y. Iwasawa, J. Phys.: Conf. Ser. 430, 012020 (2013) 10.1088/1742-6596/430/1/012020.
19. T. Ishikawa, K. Tamasaku, and M. Yabashi, Nucl. Instrum. Methods Phys. Res. Sect. A 547, 42 (2005). 10.1016/j.nima.2005.05.010
20. 2 powder.
21. G. García, A. Pérez, and J. Campos, Phys. Rev. A 38, 654 (1988). 10.1103/PhysRevA.38.654
22. K. S. Kim, N. Winograd, and R. E. Davis, J. Am. Chem. Soc. 93, 6296 (1971). 10.1021/ja00752a065
23. J. Hammond and N. Winograd, J. Electroanal. Chem. Interfacial Electrochem. 78, 55 (1977). 10.1016/S0022-0728(77)80422-1
24. C. Chen, G. Levitin, D. W. Hess, and T. F. Fuller, J. Power Sources 169, 288 (2007). 10.1016/j.jpowsour.2007.03.037