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Volumn 169, Issue 2, 2007, Pages 288-295
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XPS investigation of Nafion® membrane degradation
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Author keywords
Fenton's test; Fourier transform infrared spectroscopy; Membrane degradation; Membrane electrode assembly; Nafion ; X ray photoelectron spectroscopy
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Indexed keywords
DEGRADATION;
ELECTRODES;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
X RAY ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
FENTON'S TEST;
MEMBRANE DEGRADATION;
MEMBRANE ELECTRODE ASSEMBLY;
POLYMERIC MEMBRANES;
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EID: 34248594146
PISSN: 03787753
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jpowsour.2007.03.037 Document Type: Article |
Times cited : (227)
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References (32)
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