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Volumn 169, Issue 2, 2007, Pages 288-295

XPS investigation of Nafion® membrane degradation

Author keywords

Fenton's test; Fourier transform infrared spectroscopy; Membrane degradation; Membrane electrode assembly; Nafion ; X ray photoelectron spectroscopy

Indexed keywords

DEGRADATION; ELECTRODES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; X RAY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34248594146     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2007.03.037     Document Type: Article
Times cited : (227)

References (32)
  • 15
    • 85070172197 scopus 로고    scopus 로고
    • K. Mitsuda, NEDO Rep., FY. 1996, 1997, p. 90.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.