Subthreshold region conduction and 1/f noise empirical models in N-MOSFETs

European Solid-State Device Research Conference

Volumn , Issue , 2003, Pages 445-448

  Pichon, L ^a   Routoure, J M ^a   Carin, R ^a   Nze Mekwama, L ^a  

^a UNIVERSITÉ DE CAEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; EMPIRICAL MODEL; NMOSFETS; SUB-THRESHOLD REGIONS;

EID: 84907709741     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2003.1256909     Document Type: Conference Paper

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