Design for reliability of multi-layer stretchable interconnects

Journal of Micromechanics and Microengineering

Volumn 24, Issue 9, 2014, Pages

  Hsu, Yung Yu ^a   Papakyrikos, Cole ^a   Liu, Daniel ^a   Wang, Xianyan ^a   Raj, Milan ^a   Zhang, Baosheng ^a   Ghaffari, Roozbeh ^a  

^a MC10 Inc   (United States)

Author keywords

failure analysis; interconnect; reliability; stretchable electronics

Indexed keywords

RELIABILITY;

DESIGN FOR RELIABILITY; INTERCONNECT; STRETCHABLE ELECTRONICS;

FAILURE ANALYSIS;

EID: 84907707082     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/24/9/095014     Document Type: Article

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