The effective equivalence of geometric irregularity and surface roughness in determining particle single-scattering properties

Optics Express

Volumn 22, Issue 19, 2014, Pages 23620-23627

  Liu, Chao ^a   Panetta, R Lee ^a   Yang, Ping ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GEOMETRY; SURFACE SCATTERING;

DIELECTRIC PARTICLES; GEOMETRIC IRREGULARITY; IRREGULAR GEOMETRIES; NATURALLY OCCURRING; REGULAR CONFIGURATION; SCATTERING PHASE FUNCTION; SCATTERING PROPERTY; SINGLE SCATTERING PROPERTIES;

SURFACE ROUGHNESS;

DEVICES; LIGHT; OPTICS; PARTICLE SIZE; RADIATION SCATTERING; SURFACE PROPERTY;

LIGHT; OPTICS AND PHOTONICS; PARTICLE SIZE; SCATTERING, RADIATION; SURFACE PROPERTIES;

EID: 84907487538     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.023620     Document Type: Article

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